High-Resolution (S)TEM for Materials Science | Spectra 300 | Transmission Electron Microscope | Thermo Fisher Scientific - CN

产品简介

Spectra 300 (S)TEM is a high-resolution (S)TEM for materials science and semiconductor research with aberration correction, EDS/EELS, and 4D STEM for atomic-scale analysis

支持按工艺目标、样本类型与通量要求进行选型建议。